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• W2074172783 endingPage "12883" @default.
• W2074172783 startingPage "12880" @default.
• W2074172783 abstract "The growth and annealing properties of Pd overlayers on Cu(100) have been investigated using reemitted positron spectroscopy, electron work function, Auger electron spectroscopy, low-energy electron diffraction, and Rutherford backscattering spectroscopy. Changes in the overlayer growth mode have been observed at ensuremath{sim}0.5- and ensuremath{sim}1-ML Pd coverages, corresponding to the completion of the first and second alloy layers, the latter also being associated with the beginning of the growth of bulk Pd. For 0.5-ML Pd overlayers, the annealing of the alloy surface defects has been observed at 353 K to have a characteristic time constant of ensuremath{tau}=82ifmmodepmelsetextpmfi{}5 min. These studies represent a detailed correlation between the positron reemission yield and surface morphology and defects." @default.
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• W2074172783 date "1992-11-15" @default.
• W2074172783 modified "2023-10-16" @default.
• W2074172783 title "Positron reemission studies of the growth and defects of palladium overlayers on Cu(100)" @default.
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• W2074172783 doi "https://doi.org/10.1103/physrevb.46.12880" @default.
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