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- W2074328152 abstract "High quality Bi2Sr2Ca1Cu2Ox (Bi-2212) films with thickness around 1–2 μm have been grown on (1 0 0) LaAlO3 single crystal substrates using an electrodeposition technique, followed by a melt quench and annealing process. X-ray diffraction (XRD) measurements of the final films indicated that the films were almost pure biaxially textured Bi-2212 films. The full width at half maximum (FWHM) of omega and phi scans were about 1.7° and 1.1°, respectively. In magnetization measurements, Tc of 79 K and Jc of 0.58 MA/cm2 (4.2 K, 0 T) and 44 kA/cm2 (50 K, 0 T) were observed. The mechanism of the convention of Bi-2201 phase to Bi-2212 phase during the annealing process was discussed, the length scale for the current flow in Bi-2212 film was calculated from the differential susceptibility dm/dH during re-penetration of magnetic field, and the residual stress in the films were estimated from XRD θ–2θ scans." @default.
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- W2074328152 date "2003-12-01" @default.
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- W2074328152 title "Growth of 1–2 μm thick biaxially textured Bi-2212 films on (100) LaAlO3 single crystal substrates by electrodeposition" @default.
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- W2074328152 doi "https://doi.org/10.1016/s0921-4534(03)01309-1" @default.
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