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- W2074365280 abstract "Some testing problems in CMOS circuits are presented, including stuck-open and stuck-on faults, bridging faults, and excessive leakage in dynamic CMOS circuits. It is shown that the current consumption of a faulty CMOS circuit is several orders of magnitude greater than that of the fault-free circuit: hence, consumption measurement may be a suitable way of testing. Test by consumption measurement provides improved controllability and observability of some faults in comparison with the logic test. >" @default.
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- W2074365280 date "1989-06-01" @default.
- W2074365280 modified "2023-10-11" @default.
- W2074365280 title "Fault detection in CMOS circuits by consumption measurement" @default.
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- W2074365280 doi "https://doi.org/10.1109/19.32191" @default.
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