Matches in SemOpenAlex for { <https://semopenalex.org/work/W2074682772> ?p ?o ?g. }
Showing items 1 to 72 of
72
with 100 items per page.
- W2074682772 endingPage "131" @default.
- W2074682772 startingPage "123" @default.
- W2074682772 abstract "The properties of the space-charge region induced in the oxide film by ionizing radiation are studied. The experiments described show that a steady state is reached when either a constant gate-voltage or a constant drain voltage and current is maintained during irradiation. A model is suggested which assumes that the effects of irradiation are the creation of electron-hole pairs within the oxide and the injection of electrons from the cathode. On étudie les propriétés de la zone de charge d'espace créée par les radiations ionisantes dans la couche d'oxyde. Les expériences décrites montrent qu'un état permanent sous irradiation est atteint soit quand on maintient la tension grille constante, soit lorsque on maintient constants la tension et le courant drain. Un modèle est proposé, dans lequel on suppose que la rayonnement a pour effet de créer des paires électrons-trous dans l'oxyde et de provoquer une injection d'électrons par la cathode. Man untersucht die Eigenschaften der von den in der Oxydschicht ionisierenden Strahlungen verursachten Raumladungszone. Die Beschriebenen Experimente zeigen, dass ein permanenter Zustand unter Bestrahlung erreicht wird, entweder wenn man die Gitterspannung oder die Saugspannung und die Saugstromstärke am Kollektor konstant hält. Man schlägt ein Modell vor, bei dem man annimmt, dass die Strahlung Paare von Elektronen und Löchern im Oxydschafft und durch die Kathode eine Injektion von Elektronen verursacht." @default.
- W2074682772 created "2016-06-24" @default.
- W2074682772 creator A5002844151 @default.
- W2074682772 creator A5021396335 @default.
- W2074682772 creator A5048235525 @default.
- W2074682772 creator A5049647704 @default.
- W2074682772 date "1969-02-01" @default.
- W2074682772 modified "2023-10-16" @default.
- W2074682772 title "Effects of ionizing radiation on MOS devices" @default.
- W2074682772 cites W1978124763 @default.
- W2074682772 cites W1985210345 @default.
- W2074682772 cites W1996500428 @default.
- W2074682772 cites W1998757961 @default.
- W2074682772 cites W2006147420 @default.
- W2074682772 cites W2009616518 @default.
- W2074682772 cites W2065073135 @default.
- W2074682772 cites W2093110053 @default.
- W2074682772 cites W2134088609 @default.
- W2074682772 cites W2143337574 @default.
- W2074682772 cites W2144737100 @default.
- W2074682772 cites W2149397170 @default.
- W2074682772 doi "https://doi.org/10.1016/0038-1101(69)90121-x" @default.
- W2074682772 hasPublicationYear "1969" @default.
- W2074682772 type Work @default.
- W2074682772 sameAs 2074682772 @default.
- W2074682772 citedByCount "23" @default.
- W2074682772 crossrefType "journal-article" @default.
- W2074682772 hasAuthorship W2074682772A5002844151 @default.
- W2074682772 hasAuthorship W2074682772A5021396335 @default.
- W2074682772 hasAuthorship W2074682772A5048235525 @default.
- W2074682772 hasAuthorship W2074682772A5049647704 @default.
- W2074682772 hasConcept C111337013 @default.
- W2074682772 hasConcept C113196181 @default.
- W2074682772 hasConcept C121332964 @default.
- W2074682772 hasConcept C147120987 @default.
- W2074682772 hasConcept C147789679 @default.
- W2074682772 hasConcept C18231593 @default.
- W2074682772 hasConcept C185544564 @default.
- W2074682772 hasConcept C185592680 @default.
- W2074682772 hasConcept C43617362 @default.
- W2074682772 hasConcept C49110097 @default.
- W2074682772 hasConceptScore W2074682772C111337013 @default.
- W2074682772 hasConceptScore W2074682772C113196181 @default.
- W2074682772 hasConceptScore W2074682772C121332964 @default.
- W2074682772 hasConceptScore W2074682772C147120987 @default.
- W2074682772 hasConceptScore W2074682772C147789679 @default.
- W2074682772 hasConceptScore W2074682772C18231593 @default.
- W2074682772 hasConceptScore W2074682772C185544564 @default.
- W2074682772 hasConceptScore W2074682772C185592680 @default.
- W2074682772 hasConceptScore W2074682772C43617362 @default.
- W2074682772 hasConceptScore W2074682772C49110097 @default.
- W2074682772 hasIssue "2" @default.
- W2074682772 hasLocation W20746827721 @default.
- W2074682772 hasOpenAccess W2074682772 @default.
- W2074682772 hasPrimaryLocation W20746827721 @default.
- W2074682772 hasRelatedWork W1673008620 @default.
- W2074682772 hasRelatedWork W1999147153 @default.
- W2074682772 hasRelatedWork W2010049270 @default.
- W2074682772 hasRelatedWork W2082591874 @default.
- W2074682772 hasRelatedWork W2086395407 @default.
- W2074682772 hasRelatedWork W2092198327 @default.
- W2074682772 hasRelatedWork W2369477799 @default.
- W2074682772 hasRelatedWork W2415044043 @default.
- W2074682772 hasRelatedWork W2889997997 @default.
- W2074682772 hasRelatedWork W69032430 @default.
- W2074682772 hasVolume "12" @default.
- W2074682772 isParatext "false" @default.
- W2074682772 isRetracted "false" @default.
- W2074682772 magId "2074682772" @default.
- W2074682772 workType "article" @default.