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• W2075018429 endingPage "1740" @default.
• W2075018429 startingPage "1735" @default.
• W2075018429 abstract "A method based on the failure analysis of power MOSFET devices tested under extreme electrothermal fatigue is proposed. Failure modes are associated to several structural changes that have been investigated through acoustic, electron and ion microscopy. The main aging mode is related to the exponential increase in drain resistance due to delamination at the die attach. Earlier failures are observed when very local defects due to electrical over stresses (EOS) occur at the source metallization or at the wire bonding. Aging models were elaborated to account for the die attach delamination, but are still lacking to take in account the structural evolution of the Al metallization. This new methodology, based on accelerated tests and structural observations aims at designing a new generation of power components that will be more reliable." @default.
• W2075018429 created "2016-06-24" @default.
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• W2075018429 date "2007-09-01" @default.
• W2075018429 modified "2023-09-30" @default.
• W2075018429 title "Characterization and modelling of ageing failures on power MOSFET devices" @default.
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• W2075018429 doi "https://doi.org/10.1016/j.microrel.2007.07.055" @default.
• W2075018429 hasPublicationYear "2007" @default.
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