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• W2075614181 abstract "High-resolution electron diffraction patterns have been measured with a micro-densitometer, giving direct and unambiguous evidence of pseudomorphism. This technique is shown to give extremely accurate misfit values. The systems studied, Ni/(100)Cu and Cu/(100)Ni, show some remarkable differences. A tentative explanation for these, in terms of possible interference from oxide layers, is suggested." @default.
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• W2075614181 date "1969-07-01" @default.
• W2075614181 modified "2023-09-23" @default.
• W2075614181 title "Pseudomorphism in the (100) Ni-Cu system" @default.
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• W2075614181 doi "https://doi.org/10.1016/0040-6090(69)90020-0" @default.
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