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- W2075743266 abstract "The effects of deposition temperature on growth, composition, structure, adhesion properties, stress, and resistivity of chemically vapor deposited W deposited purely by SiH4 reduction of WF6 are discussed. At lower deposition temperatures, due to incomplete Si reduction reaction, a small amount of Si is incorporated in the film. This elemental Si in W is responsible for the observed high stresses and high resistivities over a wide temperature range. With the increase in the deposition temperature, the conversion of incorporated Si as well as the initial Si reduction are taking place, stimulating increased grain growth and thereby relieving stress and reducing resistivity. The optimum values for stress and resistivity are achieved around 500 °C, as Si content is at its minimum. At higher temperatures the reaction between residual Si and W, is the prime cause of resistivity increase." @default.
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- W2075743266 date "1990-12-01" @default.
- W2075743266 modified "2023-09-25" @default.
- W2075743266 title "Mechanisms controlling temperature dependent mechanical and electrical behavior of SiH<sub>4</sub>reduced chemically vapor deposited W" @default.
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- W2075743266 doi "https://doi.org/10.1063/1.346974" @default.
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