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• W2076426714 abstract "Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Sang Won Lee, Si Young Lee, Seong Chu Lim, Young-dong Kwon, Joo-Sun Yoon, Keehan Uh, Young Hee Lee; Positive gate bias stress instability of carbon nanotube thin film transistors. Appl. Phys. Lett. 30 July 2012; 101 (5): 053504. https://doi.org/10.1063/1.4740084 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search" @default.
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• W2076426714 date "2012-07-30" @default.
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• W2076426714 title "Positive gate bias stress instability of carbon nanotube thin film transistors" @default.
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• W2076426714 doi "https://doi.org/10.1063/1.4740084" @default.
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