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• W2076456472 abstract "The use of atomic force microscopy (AFM) to tailor and image ferroelectric domains in the submicron and nanometer ranges is gaining increasing attention. Many applications have been developed that make use of the superhigh electric field generated by the sharp AFM tip in a local area. In this article, we derive an explicit expression for the AFM-induced electric field in a ferroelectric thin film. Based on a similar approach, we also obtain the depolarization field created by polarization charges using the Green function technique. Based on the expressions derived, the effects of the substrate are discussed." @default.
• W2076456472 created "2016-06-24" @default.
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• W2076456472 date "2003-09-15" @default.
• W2076456472 modified "2023-09-26" @default.
• W2076456472 title "Atomic force microscopy-induced electric field in ferroelectric thin films" @default.
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• W2076456472 doi "https://doi.org/10.1063/1.1603345" @default.
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