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- W2076519653 abstract "The topmost 20 nm of an electropolished Al–1 at.% Cu alloy has been investigated at sub-nanometre resolution using medium-energy ion scattering. Differences in the composition and depth of the enriched Cu layer are observed. Most significantly, the enriched layer contains regions of differing structure and/or lattice orientation with Cu atoms located in distinct ordered regions, consistent with the presence of Cu-rich clusters. Surface-segregated Si and Cu are observed and Cl and Cu are found in the oxide. Copyright © 2001 John Wiley & Sons, Ltd." @default.
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- W2076519653 date "2001-01-01" @default.
- W2076519653 modified "2023-09-27" @default.
- W2076519653 title "Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering" @default.
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- W2076519653 doi "https://doi.org/10.1002/sia.1098" @default.
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