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- W2076814875 abstract "Long-term electrical stability measurements, including current/bias stress and aging over 18 months of idle shelf life are presented for GIZO-based TFTs. The effects of oxygen partial pressure, annealing temperature and passivation are discussed. Optimized devices show highly stable properties, such as a recoverable ΔVT<0.5 V after 24h of ID=10 μA stress, quite promising for integration in electronic circuits." @default.
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- W2076814875 date "2010-01-01" @default.
- W2076814875 modified "2023-09-24" @default.
- W2076814875 title "P-202L: Late-News Poster: Long-Term Stability of Oxide Semiconductor- Based TFTs" @default.
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- W2076814875 doi "https://doi.org/10.1889/1.3499958" @default.
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