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- W2077386140 abstract "The phenomenon of device instability governed by electron trapping was investigated in pentacene field-effect transistors. We found that the threshold voltage shift (ΔVT) increases significantly when the device is exposed to photo-irradiation with the depletion gate bias. This effect reveals that a number of electron trapping sites are located in the pentacene band gap, presenting the mechanism of the photo-induced ΔVT. In addition, we found the specific shift of bias-stressed ΔVT under a monochromatic of 690-500 nm, which reflects that the electron trap states would be distributed between the energy levels of 1.8 and 2.5 eV in the gap state." @default.
- W2077386140 created "2016-06-24" @default.
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- W2077386140 date "2012-02-06" @default.
- W2077386140 modified "2023-10-03" @default.
- W2077386140 title "Investigation of the device instability feature caused by electron trapping in pentacene field effect transistors" @default.
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- W2077386140 doi "https://doi.org/10.1063/1.3680248" @default.
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