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• W2077602983 abstract "This article proposes a more accurate approach to dopant extraction using combined inverse modeling and forward simulation of scanning capacitance microscopy (SCM) measurements on p-n junctions. The approach takes into account the essential physics of minority carrier response to the SCM probe tip in the presence of lateral electric fields due to a p-n junction. The effects of oxide fixed charge and interface state densities in the grown oxide layer on the p-n junction samples were considered in the proposed method. The extracted metallurgical and electrical junctions were compared to the apparent electrical junction obtained from SCM measurements." @default.
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• W2077602983 date "2002-06-17" @default.
• W2077602983 modified "2023-09-27" @default.
• W2077602983 title "Dopant extraction from scanning capacitance microscopy measurements of p-n junctions using combined inverse modeling and forward simulation" @default.
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• W2077602983 doi "https://doi.org/10.1063/1.1487899" @default.
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