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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2078032730> ?p ?o ?g. }

• W2078032730 abstract "Highly defective 16-Mb chips have been stressed under accelerated conditions to test the capability of on-chip error-correction circuits for reliability enhancement. The tradeoff between a manufacturing sort or screen yield and reliability was determined. The soft-error immunity of the trench capacitor technology in conjunction with error correction was also evaluated under accelerated conditions. >" @default.
• W2078032730 created "2016-06-24" @default.
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• W2078032730 date "1992-01-01" @default.
• W2078032730 modified "2023-09-23" @default.
• W2078032730 title "The evaluation of 16-Mbit memory chips with built-in reliability" @default.
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• W2078032730 doi "https://doi.org/10.1109/relphy.1992.187613" @default.
• W2078032730 hasPublicationYear "1992" @default.
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