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- W2078283992 abstract "physica status solidi (a)Volume 126, Issue 2 p. K123-K127 Short Note Application of Electrochemical Capacitance - Voltage Measurements for Profiling in Silicon N. Sieber, N. Sieber Central Institute for Nuclear Research, Dresden Search for more papers by this authorH. E. Wulf, H. E. Wulf Halbleiterwerk GmbH, Frankfurt (Oder) Search for more papers by this authorD. Röser, D. Röser Halbleiterwerk GmbH, Frankfurt (Oder) Search for more papers by this authorP. Kurps, P. Kurps Halbleiterwerk GmbH, Frankfurt (Oder) Search for more papers by this author N. Sieber, N. Sieber Central Institute for Nuclear Research, Dresden Search for more papers by this authorH. E. Wulf, H. E. Wulf Halbleiterwerk GmbH, Frankfurt (Oder) Search for more papers by this authorD. Röser, D. Röser Halbleiterwerk GmbH, Frankfurt (Oder) Search for more papers by this authorP. Kurps, P. Kurps Halbleiterwerk GmbH, Frankfurt (Oder) Search for more papers by this author First published: 16 August 1991 https://doi.org/10.1002/pssa.2211260234Citations: 6 PF 19, C-8051 Dresden, FRG. O-1201 Frankfurt/Markendorf, FRG. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume126, Issue216 August 1991Pages K123-K127 RelatedInformation" @default.
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- W2078283992 title "Application of Electrochemical Capacitance - Voltage Measurements for Profiling in Silicon" @default.
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