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- W2078302199 abstract "Electronic Speckle Pattern Interferometry (ESPI) is now fifteen years old. What has held it back in its development? Some recent developments enabling ESPI to become a commercial instrument capable of solving specific industrial tasks will be discussed. The use of this instrument to assist both the opto-mechanical engineer and the experimental engineer to help solve problems raised at product design level as well as later when "fire fighting" pre-production and in- situ crisis that require very short investigative response times." @default.
- W2078302199 created "2016-06-24" @default.
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- W2078302199 date "1986-01-01" @default.
- W2078302199 modified "2023-10-13" @default.
- W2078302199 title "Critical Review Of Recent Developments In Electronic Speckle Pattern Interferometry" @default.
- W2078302199 doi "https://doi.org/10.1117/12.966617" @default.
- W2078302199 hasPublicationYear "1986" @default.
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