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• W2078397742 abstract "In this paper we engineer the programming method at 10μA in Cu/Al 2 O 3 -based CBRAM to reduce the bit dispersion and the state instability over time. Despite its large median value, the overall HRS/LRS ratio in these devices can be drastically reduced due to the LRS and HRS dispersion, especially in a low-current regime. For this reason, in this study we adopt a statistical approach, focusing on the tails of the cumulative distribution Function (CDF). Using different verify-based algorithms we force an initial tail-to-tail (1st percentile of CDF) resistive window, demonstrating that, in order to reduce the total programming time, a complete Write/Erase cycle must be performed at each verify step. We also prove that the stability of the programmed LRS/HRS states is affected by the programming pulse width (PW) used in the algorithm. Selecting the appropriate PW, no overlap of the LRS and HRS distributions is observed after 1 week at room temperature." @default.
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• W2078397742 date "2015-09-01" @default.
• W2078397742 modified "2023-10-01" @default.
• W2078397742 title "Optimization of the write algorithm at low-current (10&#x03BC;A) in Cu/Al<inf>2</inf>O<inf>3</inf>-based conductive-bridge RAM" @default.
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• W2078397742 doi "https://doi.org/10.1109/essderc.2015.7324726" @default.
• W2078397742 hasPublicationYear "2015" @default.
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