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• W2078408065 abstract "The Cu2−xS/CdS photovoltaic device is the most thoroughly studied and developed polycrystalline thin-film solar cell. However, many of the fundamental relationships between processing, microstructure and device performance are essentially unknown. Critical to understanding these relationships is the determination of the Cu2−xS/CdS interface morphology and the phase distribution in the Cu2−xS absorber. In this study electron-optical methods are applied to the structural characterization of single-crystal Cu2−xS/CdS heterojunctions prepared by the aqueous ion-exchange process. Results obtained by scanning electron microscopy, transmission electron microscopy and diffraction, and cross-sectional high-resolution transmission electron microscopy (XHRTEM) are combined to develop a detailed description of the effect of surface texture on heterojunction morphology. The XHRTEM images reveal the two-phase nature of the Cu2S absorber. The tetragonal phase, a high-pressure polymorph of low chalcocite (Cu2S), is found to form the metallurgical junction with CdS if the local surface orientation is nearly basal. However, only low chalcocite is detected in the absorber layer if the surface is steeply inclined to the basal plane. These results are rationalized on the basis of lattice misfit, structural compatibility and the nucleation of hcp-tp-fcc transformation dislocations. The implications of these results for the reproducible fabrication of high-efficiency Cu2−xS/CdS solar cells are discussed." @default.
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• W2078408065 date "1984-08-01" @default.
• W2078408065 modified "2023-10-10" @default.
• W2078408065 title "Interface morphology and phase distribution in the Cu2−xS/CdS heterojunction: A transmission electron microscope investigation" @default.
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• W2078408065 doi "https://doi.org/10.1016/0165-1633(84)90041-8" @default.
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