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• W2078447198 abstract "This paper contains the results of the detailed simulation study of the role of ion-enhanced field emission on the breakdown voltage in argon, xenon and krypton at high frequencies. Calculations were performed by using a one-dimensional particle-in-cell/Monte Carlo collisions (PIC/MCC) code with the secondary emission model adjusted to include field emission effects in microgaps. The obtained simulation results clearly show that electrical breakdown across micron-size gaps may occur at voltages far below the minimum predicted by the conventional Paschen curve. The observed breakdown voltage reduction may be attributed to the onset of ion-enhanced field emission." @default.
• W2078447198 created "2016-06-24" @default.
• W2078447198 creator A5011272633 @default.
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• W2078447198 date "2007-03-19" @default.
• W2078447198 modified "2023-10-16" @default.
• W2078447198 title "The influence of ion-enhanced field emission on the high-frequency breakdown in microgaps" @default.
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• W2078447198 doi "https://doi.org/10.1088/0963-0252/16/2/017" @default.
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