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• W2078682997 abstract "Er-, Nd- and Tm-doped Si-yttria stabilized zirconia (YSZ) thin film samples were prepared by rf co-sputtering. Chemical composition of the samples was determined using energy-dispersive spectroscopy (EDS) and the structure of the films by x-ray diffraction (XRD). The samples were annealed to 700 °C. Photoluminescence (PL) measurements were performed for the visible and infrared. Excitation with 457.9 nm produces spectra in the visible range due mostly to defects in the YSZ matrix with a weak Si nanoparticle surface state emission; the Tm-doped samples also present emission. Excitation with 488 nm produces spectra in the visible range with additional rare earth emissions such as the and emissions for the Er-doped samples and the emissions for the Nd-doped samples. The Er-doped samples present weak emissions and narrow emissions in the infrared range, while the Nd-doped samples present and emissions. No Tm3+ emissions in the infrared were observed. Excitation wavelength dependence measurements for the emissions show that these are due to energy transfer from the defects in the YSZ as well as from the Si nanoparticles while the same measurements for the emissions show that these are due to energy transfer from the Si nanoparticles only. Excitation flux dependence measurements for the and emissions show the sub-linear dependence characteristic of rare earth ion excitation through energy transfer from Si nanoparticles. emission dependence on emission showed that the former was possibly due to a combination of downconversion from higher levels of the Er ions, energy transfer from Si nanoparticles and upconversion transfer processes. We concluded that Er-, Nd- and Tm-doped Si-YSZ are promising materials for photonic applications, being easily broadband excited using low pumping powers." @default.
• W2078682997 created "2016-06-24" @default.
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• W2078682997 date "2008-06-26" @default.
• W2078682997 modified "2023-09-25" @default.
• W2078682997 title "Comparative study of the luminescence properties of Er-, Nd- and Tm-doped Si–ZrO2CO-sputtered films" @default.
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• W2078682997 doi "https://doi.org/10.1088/0953-8984/20/31/315003" @default.
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