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- W2078904586 abstract "An improved compact model for radiation effect characterization in SOI MOSFETs is presented. This model is proposed by considering the threshold voltage degradation as a function of the total dose. The standard Berkeley BSIMSOI3 Verilog-A code implemented in ICCAP software was applied as a basis for modelling work.The accuracy of the model has been verified by comparison of simulated and measured post-radiation device characteristics of partially depleted (PD) SOI MOSFETs." @default.
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- W2078904586 date "2014-10-01" @default.
- W2078904586 modified "2023-09-27" @default.
- W2078904586 title "An improved compact model for radiation effect characterization in SOI MOSFETs" @default.
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- W2078904586 doi "https://doi.org/10.1109/icsict.2014.7021477" @default.
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