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• W2078998056 abstract "The impact of deep sub-micron CMOS transistor reliability on RF oscillator phase noise degradation is demonstrated along with the importance of off-state drain stress for large signal RF applications. Process and device optimization was successful in reducing phase noise degradation to acceptable levels." @default.
• W2078998056 created "2016-06-24" @default.
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• W2078998056 date "2009-12-01" @default.
• W2078998056 modified "2023-09-24" @default.
• W2078998056 title "Impact of transistor reliability on RF oscillator phase noise degradation" @default.
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• W2078998056 doi "https://doi.org/10.1109/iedm.2009.5424341" @default.
• W2078998056 hasPublicationYear "2009" @default.
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