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• W2079008234 startingPage "024101" @default.
• W2079008234 abstract "To attain a deep understanding of ferroelectric and piezoelectric characteristics of K0.5Na0.5NbO3 as a promising lead-free compound, the ferroelectric and piezoelectric responses of its epitaxially grown films with three primary orientations of [001], [110], and [111] were investigated with an emphasis on the influence of crystallographic orientation. The films were prepared by sol-gel processing using Nb-doped SrTiO3 single-crystalline substrates with various cutting directions. A peak remnant polarization value (Pr) of 17.3 μC/cm2 was obtained along the [110] direction due to the coincidence between the spontaneous polarization and the film orientation, which is significantly higher than 10.5 μC/cm2 in [111]-oriented and 10.1 μC/cm2 in [001]-oriented ones. However, a better piezoelectric response was achieved in the [001]-oriented films with an average local effective piezoelectric coefficient (d33) of 50.5 pm/V, as compared with 45.1 pm/V and 39.7 pm/V in [110]- and [111]-oriented films, respectively." @default.
• W2079008234 created "2016-06-24" @default.
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• W2079008234 date "2013-01-14" @default.
• W2079008234 modified "2023-10-06" @default.
• W2079008234 title "Electrical properties of K_0.5Na_0.5NbO₃ thin films grown on Nb:SrTiO₃ single-crystalline substrates with different crystallographic orientations" @default.
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• W2079008234 doi "https://doi.org/10.1063/1.4773542" @default.
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