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- W2079143146 abstract "We plan to start the Belle II experiment in 2015 and to continue data taking for more than ten years. Because some of the front-end electronics cards of Belle II are located inside the detector, radiation effects onto their components will be a severe problem. Using experimental exposure facilities of neutrons and γ rays, we study the radiation effects from these particles to the Virtex-5 FPGA, optical transceivers, and voltage regulators. The Virtex-5 FPGA is found to keep its operation after irradiation of more than 20-year-equivalent neutron flux of Belle II and 88-year-equivalent γ-ray dose. We observe single event upsets (SEUs) and multiple bit upsets (MBUs) in the Virtex-5 FPGA in the neutron irradiation. We also find almost doubled SEU counts in the Virtex-5 FPGA bombarded from its tail side than its head side. We extrapolate the observed SEU and MBU counts in the Virtex-5 FPGA to the entire readout system of the Belle II central drift chamber, and expect the SEU and MBU rates as one SEU per four minutes and one MBU per 11.5 hours, respectively. The optical transceivers are found to keep its operation after integration of 12-year-equivalent neutron flux, while they are killed by about 3-year-equivalent γ-ray dose, which should be solved in the future research. The voltage regulators are found to keep its operation for more than 10-year-equivalent γ-ray dose." @default.
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- W2079143146 date "2012-02-09" @default.
- W2079143146 modified "2023-10-02" @default.
- W2079143146 title "Radiation tolerance of readout electronics for Belle II" @default.
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- W2079143146 doi "https://doi.org/10.1088/1748-0221/7/02/c02022" @default.
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