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• W2079167318 abstract "Hole current was directly observed in oxide semiconductors under illumination. Two stacks were fabricated, with In-Ga-Zn-O (IGZO) as the channel and SiO2 or SiNx as the gate insulator. X-ray photoelectron spectroscopy confirmed the IGZO/SiNx interface has no hole barrier while the IGZO/SiO2 interface has a significant one. This was used to analyze hole generation in IGZO by illuminating light at various wavelengths. As a result, a threshold wavelength, where holes start to emerge in the channel, was found to exist. Negative bias-illumination-temperature stress experiments showed that no additional threshold voltage shift exists at wavelengths longer than this threshold wavelength." @default.
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• W2079167318 date "2011-01-01" @default.
• W2079167318 modified "2023-10-17" @default.
• W2079167318 title "Direct Observation of Hole Current in Amorphous Oxide Semiconductors under Illumination" @default.
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• W2079167318 doi "https://doi.org/10.1149/1.3567027" @default.
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