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• W2079187183 abstract "This work introduces electrochemical nanolithography (ENL), a single-step method in which a metal thin film is locally etched without application of a mask on a 100 nm length scale with an electrochemical atomic force microscope (AFM). The method requires the application of ultra-short voltage pulses on the tip (nanosecond range duration, 2-4 V amplitude), while both the sample and the metalized tip are under independent potentiostatic control for full control of interface reactions in an AFM electrochemical cell. It is demonstrated that Cu films as well as Co and Cu/Co sandwich magnetic films can be patterned if negative voltage pulses are applied to the tip. This method also applies to films deposited on an insulating substrate. Moreover the lateral dimension of lithographed structures is tunable, from a few micrometers down to 150 nm, by appropriate choice of ENL conditions. Simulation of the dissolution process is discussed." @default.
• W2079187183 created "2016-06-24" @default.
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• W2079187183 date "2008-07-02" @default.
• W2079187183 modified "2023-09-25" @default.
• W2079187183 title "Single-step electrochemical nanolithography of metal thin films by localized etching with an AFM tip" @default.
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• W2079187183 doi "https://doi.org/10.1088/0957-4484/19/32/325301" @default.
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