Matches in SemOpenAlex for { <https://semopenalex.org/work/W2079232648> ?p ?o ?g. }
- W2079232648 endingPage "582" @default.
- W2079232648 startingPage "573" @default.
- W2079232648 abstract "A brief overview of recent issues concerning the low frequency (LF) noise in modern CMOS devices is given. The approaches such as the carrier number and the Hooge mobility fluctuations used for the analysis of the noise sources are presented and illustrated through experimental results obtained on advanced CMOS generations. The use of the LF noise measurements as a characterization tool of large area MOS devices is also discussed. The main physical features of random telegraph signals (RTSs) observed in small area MOS transistors are reviewed. The impact of scaling on the LF noise and RTS fluctuations in CMOS silicon devices is also addressed. Experimental results obtained on 0.18 μm CMOS technologies are used to predicting the trends for the noise figure of foregoing CMOS technologies e.g. 0.1 μm and beyond. The formulation of the thermal noise underlying the LF fluctuations in MOSFETs is recalled for completeness." @default.
- W2079232648 created "2016-06-24" @default.
- W2079232648 creator A5011270757 @default.
- W2079232648 creator A5055492395 @default.
- W2079232648 date "2002-04-01" @default.
- W2079232648 modified "2023-10-08" @default.
- W2079232648 title "Electrical noise and RTS fluctuations in advanced CMOS devices" @default.
- W2079232648 cites W1637370262 @default.
- W2079232648 cites W1964275537 @default.
- W2079232648 cites W1968929663 @default.
- W2079232648 cites W1985090973 @default.
- W2079232648 cites W1991376963 @default.
- W2079232648 cites W1991387963 @default.
- W2079232648 cites W1994881001 @default.
- W2079232648 cites W2000991393 @default.
- W2079232648 cites W2004769250 @default.
- W2079232648 cites W2006983911 @default.
- W2079232648 cites W2008742474 @default.
- W2079232648 cites W2012904036 @default.
- W2079232648 cites W2013515435 @default.
- W2079232648 cites W2014220986 @default.
- W2079232648 cites W2014426329 @default.
- W2079232648 cites W2018158174 @default.
- W2079232648 cites W2024835245 @default.
- W2079232648 cites W2026748857 @default.
- W2079232648 cites W2029167101 @default.
- W2079232648 cites W2029808896 @default.
- W2079232648 cites W2031333744 @default.
- W2079232648 cites W2031616033 @default.
- W2079232648 cites W2032855871 @default.
- W2079232648 cites W2035374584 @default.
- W2079232648 cites W2035505417 @default.
- W2079232648 cites W2035778961 @default.
- W2079232648 cites W2042608497 @default.
- W2079232648 cites W2043869719 @default.
- W2079232648 cites W2050042465 @default.
- W2079232648 cites W2050105348 @default.
- W2079232648 cites W2059693859 @default.
- W2079232648 cites W2059795318 @default.
- W2079232648 cites W2063037331 @default.
- W2079232648 cites W2072498211 @default.
- W2079232648 cites W2075667362 @default.
- W2079232648 cites W2084064507 @default.
- W2079232648 cites W2086520527 @default.
- W2079232648 cites W2087379056 @default.
- W2079232648 cites W2092387582 @default.
- W2079232648 cites W2093726197 @default.
- W2079232648 cites W2097061230 @default.
- W2079232648 cites W2098876187 @default.
- W2079232648 cites W2109579517 @default.
- W2079232648 cites W2112369459 @default.
- W2079232648 cites W2112835374 @default.
- W2079232648 cites W2117173337 @default.
- W2079232648 cites W2117461740 @default.
- W2079232648 cites W2128887601 @default.
- W2079232648 cites W2129762271 @default.
- W2079232648 cites W2131585216 @default.
- W2079232648 cites W2140854355 @default.
- W2079232648 cites W2142423888 @default.
- W2079232648 cites W2149229127 @default.
- W2079232648 cites W2151561344 @default.
- W2079232648 cites W2155295500 @default.
- W2079232648 cites W2169039197 @default.
- W2079232648 cites W2171246244 @default.
- W2079232648 cites W2239688436 @default.
- W2079232648 cites W4250546584 @default.
- W2079232648 doi "https://doi.org/10.1016/s0026-2714(02)00025-2" @default.
- W2079232648 hasPublicationYear "2002" @default.
- W2079232648 type Work @default.
- W2079232648 sameAs 2079232648 @default.
- W2079232648 citedByCount "326" @default.
- W2079232648 countsByYear W20792326482012 @default.
- W2079232648 countsByYear W20792326482013 @default.
- W2079232648 countsByYear W20792326482014 @default.
- W2079232648 countsByYear W20792326482015 @default.
- W2079232648 countsByYear W20792326482016 @default.
- W2079232648 countsByYear W20792326482017 @default.
- W2079232648 countsByYear W20792326482018 @default.
- W2079232648 countsByYear W20792326482019 @default.
- W2079232648 countsByYear W20792326482020 @default.
- W2079232648 countsByYear W20792326482021 @default.
- W2079232648 countsByYear W20792326482022 @default.
- W2079232648 countsByYear W20792326482023 @default.
- W2079232648 crossrefType "journal-article" @default.
- W2079232648 hasAuthorship W2079232648A5011270757 @default.
- W2079232648 hasAuthorship W2079232648A5055492395 @default.
- W2079232648 hasConcept C112806910 @default.
- W2079232648 hasConcept C113873419 @default.
- W2079232648 hasConcept C115961682 @default.
- W2079232648 hasConcept C119599485 @default.
- W2079232648 hasConcept C127413603 @default.
- W2079232648 hasConcept C154945302 @default.
- W2079232648 hasConcept C165801399 @default.
- W2079232648 hasConcept C172385210 @default.
- W2079232648 hasConcept C194257627 @default.
- W2079232648 hasConcept C24326235 @default.
- W2079232648 hasConcept C2524010 @default.
- W2079232648 hasConcept C2778413303 @default.