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- W2079248918 abstract "During this study, a plane‐wave computer modeling approach was used to gain more insight into the response of vertical sheet conductors at very low frequency (VLF). The medium which surrounds the conductors is assumed to be a dissipative one. Magnitude and shape of the anomalous field caused by a vertical “thin” conductor at VLF is found to be dependent mainly on (1) conductivity‐thickness product of conductor, (2) resistivity of host medium, (3) depth to the top of conductor, and (4) overlying conductive overburden. Other variables being the same, a shift in frequency in the 17 to 25 kHz range does not produce an appreciable change in the overall response of modeled conductors. The lateral distance between the maximum and minimum on a tilt angle profile is related to conductivity and thickness of conductor, resistivity of the host rock, and depth to the top of the conductor in a complex manner. An interpretation scheme has been proposed to determine the conductivity‐thickness product and depth of vertical sheet conductors from tilt angle and ellipticity measurements at VLF. Resistivity of the host medium had to be incorporated in the scheme due to strong dependence of response on this parameter. Five characteristic diagrams have been constructed corresponding to host rock resistivities of 50, 250, 800, 2500, and 8000 Ω-m, which cover the most commonly encountered resistivities in the field. Conductivity‐thickness product [Formula: see text] and depth (D) of conductor can be read directly from the appropriate diagram when peak‐to‐peak tilt angle and ellipticity values are entered." @default.
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- W2079248918 date "1981-11-01" @default.
- W2079248918 modified "2023-10-18" @default.
- W2079248918 title "Very low‐frequency electromagnetic interpretation using tilt angle and ellipticity measurements" @default.
- W2079248918 doi "https://doi.org/10.1190/1.1441166" @default.
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