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- W2079302505 abstract "Abstract The chemical modulation, structure and strain in Ni/Ti multilayer thin films are analyzed using X-ray diffraction theories. The repeat period of the multilayers used in this study ranges from 1.3 × 10 −9 to 12.8 × 10 −9 m. The composition modulation is obtained by using a kinematical theory of X-ray diffraction. Interplanar spacings and the strain within each atomic layer are found by iteratively fitting the experimental X-ray diffraction curves with the simulated one from a dynamical theory of X-ray diffraction." @default.
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- W2079302505 date "1994-02-01" @default.
- W2079302505 modified "2023-09-27" @default.
- W2079302505 title "Analysis of Ni/Ti multilayers by X-ray diffraction" @default.
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- W2079302505 doi "https://doi.org/10.1016/0040-6090(94)90111-2" @default.
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