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- W2079402470 abstract "Logic behaviour of an ECL OR/NOR gate under different physical faults is examined. It is shown that the conventional stuck-at fault modelling may be inadequate for obtaining a sufficiently high fault coverage. A new augmented stuck-at fault model is presented which provides a better coverage of physical failures." @default.
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- W2079402470 date "1990-01-01" @default.
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- W2079402470 title "Fault modelling of ECL devices" @default.
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- W2079402470 doi "https://doi.org/10.1049/el:19900715" @default.
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