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- W2079714520 abstract "This study uses a v2-f turbulence model with a two phase Eulerian approach. The v2-f model can accurately calculate the near wall fluctuationsm which mainly represent the nonisotropic nature of turbulent flow near the walls. The Eulerian method was modified based on considering the most important mechanisms in the particle deposition rate when compared to the experimental data. The model performance is examined by comparing the rate of particle deposition on a vertical surface with the experimental and numerical data in a turbulent channel flow available in the literature. The model takes into account the effects of lift, turbophoretic, electrostatic, gravitational, and Brownian forces together with turbulent diffusion on the particle deposition rate. Electrostatic forces due to mirror charging and due to charged particles under the influence of an electric field were considered. The influence of the tilt angle on the particle deposition rate was investigated. The results show that, using the modified model with v2-f model predicts the rate of deposition with reasonable accuracy. It is shown that considering the turbophoretic force as the only inertia force and neglecting the lift force, leads to reasonable accuracy in predicting particle deposition rate. It is also observed that when the mirror charging and electric field are present, the electrostatic force has the dominant effect in a wider range of particles’ size. Furthermore, the results show that increasing the Reynolds number at a given tilt angle decreases the rate of particle deposition and the tilt angle has insignificant impact on the particle deposition rate in high shear velocity or high Reynolds number." @default.
- W2079714520 created "2016-06-24" @default.
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- W2079714520 date "2011-11-01" @default.
- W2079714520 modified "2023-10-17" @default.
- W2079714520 title "Predicting the Particle Deposition Characteristics Using a Modified Eulerian Method on a Tilted Surface in the Turbulent Flow" @default.
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- W2079714520 doi "https://doi.org/10.1080/02726351.2010.524975" @default.
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