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- W2080212921 abstract "It was proposed to classify semiconductor devices into groups of differentiated quality on the basis of their low-frequency noise. The methodology of semiconductor device classification taking into account results of noise investigations of two biased samples was presented." @default.
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- W2080212921 title "Methodology of semiconductor devices classification into groups of differentiated quality" @default.
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- W2080212921 doi "https://doi.org/10.1016/j.microrel.2006.12.002" @default.
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