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- W2080228719 abstract "Abstract The effects of annealing to 400°C on the properties of radiation damaged GaAs Schottky barriers is reported, the damage being introduced by implanting boron or helium ions, into the depletion layer, at room temperature. We discuss the effect of annealing on both the capacitance and current-voltage characteristics, and show that annealing to 400°C partially reverses the effects of the damage. Damage produced defect levels and their annealing, are characterised using both thermally stimulated current, and thermally stimulated capacitance techniques. It is shown that damage lying within electron tunnelling distances of the metal does not anneal as readily as that deeper in the depletion layer." @default.
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- W2080228719 date "1976-11-01" @default.
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- W2080228719 title "The effects of radiation damage on the properties of Ni-nGaAs Schottky diodes—III Annealing studies" @default.
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- W2080228719 doi "https://doi.org/10.1016/0038-1101(76)90106-4" @default.
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