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- W2080397534 abstract "Pulsed DC magnetron sputtered aluminum nitride (AlN) thin films are prepared on several seed layers and at different sputtering conditions. The piezoelectric c-axis (002) orientation of the AlN is analyzed with X-ray diffraction method. The transverse piezoelectric coefficient d31 is determined with a Laser-Doppler-Vibrometer at cantilevers and membranes by analytical calculations and finite element method. Additionally, thin film AlN on bulk silicon is used to characterize the longitudinal piezoelectric charge coefficient d33." @default.
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- W2080397534 date "2014-07-16" @default.
- W2080397534 modified "2023-10-18" @default.
- W2080397534 title "Pulsed DC magnetron sputtered piezoelectric thin film aluminum nitride – Technology and piezoelectric properties" @default.
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- W2080397534 doi "https://doi.org/10.1063/1.4887799" @default.
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