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• W2080493468 abstract "The surface roughness changes during redox-switching of (PNMP/PSS) of various thicknesses were investigated in aqueous perchlorate solutions of different cations, utilizing in situ scanning tunneling microscopy (STM). In situ STM studies show that both the surface roughness of PNMP/PSS and the roughness difference between doped and dedoped states become greater with the increase of film thicknesses, when the thickness is over a certain critical value (ca. 2 μm). It was also found that identity of dopant cations can affect the surface roughness. While PNMP/PSS (4.0 μm thick) reduced in produces a relatively smooth surface PNMP/PSS reduced in and exhibits of 2.89 and 3.24 nm, respectively. This trend holds for an entire potential range examined, even when the film was fully oxidized to minimize the dopant cation involvement 6.24, and 7.79 nm for and respectively). © 2005 The Electrochemical Society. All rights reserved." @default.
• W2080493468 created "2016-06-24" @default.
• W2080493468 creator A5009210723 @default.
• W2080493468 date "2005-01-01" @default.
• W2080493468 modified "2023-09-26" @default.
• W2080493468 title "Surface Roughness Changes of Poly(N-Methylpyrrole)/Poly(Styrene Sulfonate) with Doping in Perchlorate Solutions of Various Cations" @default.
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• W2080493468 doi "https://doi.org/10.1149/1.1856989" @default.
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