Matches in SemOpenAlex for { <https://semopenalex.org/work/W2080496724> ?p ?o ?g. }
- W2080496724 endingPage "641" @default.
- W2080496724 startingPage "624" @default.
- W2080496724 abstract "Modern synchrotron radiation (SR) sources have dramatically fostered the use of SR-based X-ray imaging. The relevant information such as density, chemical composition, chemical states, structure, and crystallographic perfection is mapped in two, or, increasingly, in three dimensions. The development of nano-science requires pushing spatial resolution down towards the nanoscale. The present article describes a selection of hard X-ray imaging and microanalysis techniques that emerged over the last few years, by taking advantage of the flux and coherence of the SR beams, as well as exploiting the advances in X-ray optics and detectors, and the increased possibilities of computers (memory, speed). Examples are given to illustrate the opportunities associated with the use of these techniques, and a number of recent references are provided. To cite this article: J. Baruchel et al., C. R. Physique 9 (2008). Les sources modernes de rayonnement synchrotron ont permis un développement considérable de l'utilisation des techniques d'imagerie. Des paramètres importants de l'échantillon tels sa densité, composition chimique, état chimique, structure et perfection cristallographique sont cartographiés à deux et, de plus en plus, à trois dimensions. Le développement des nano-sciences exige des efforts pour atteindre une résolution spatiale nanométrique. Cet article décrit une sélection de techniques d'imagerie et microanalyse utilisant des rayons X durs, qui se sont développées au cours des dernières années, grâce à l'utilisation du haut flux et cohérence des faisceaux synchrotron, tout en exploitant les avancées en optique des rayons X et détecteurs, et les performances accrues des ordinateurs (mémoire, vitesse). Cet article fournit des exemples montrant les possibilités de ces techniques, et de nombreuses références récentes. Pour citer cet article : J. Baruchel et al., C. R. Physique 9 (2008)." @default.
- W2080496724 created "2016-06-24" @default.
- W2080496724 creator A5000638270 @default.
- W2080496724 creator A5012091115 @default.
- W2080496724 creator A5012421125 @default.
- W2080496724 creator A5029609167 @default.
- W2080496724 creator A5030362453 @default.
- W2080496724 creator A5032816892 @default.
- W2080496724 creator A5035732782 @default.
- W2080496724 creator A5077388535 @default.
- W2080496724 creator A5078855596 @default.
- W2080496724 date "2008-06-01" @default.
- W2080496724 modified "2023-10-16" @default.
- W2080496724 title "Advances in synchrotron hard X-ray based imaging" @default.
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- W2080496724 doi "https://doi.org/10.1016/j.crhy.2007.08.003" @default.
- W2080496724 hasPublicationYear "2008" @default.
- W2080496724 type Work @default.
- W2080496724 sameAs 2080496724 @default.
- W2080496724 citedByCount "57" @default.
- W2080496724 countsByYear W20804967242012 @default.
- W2080496724 countsByYear W20804967242013 @default.
- W2080496724 countsByYear W20804967242014 @default.
- W2080496724 countsByYear W20804967242015 @default.
- W2080496724 countsByYear W20804967242016 @default.
- W2080496724 countsByYear W20804967242017 @default.
- W2080496724 countsByYear W20804967242018 @default.