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• W2080784241 abstract "physica status solidi (a)Volume 107, Issue 2 p. K175-K179 Short Note On the current density dependence of electromigration in thin films R. E. Hummel, R. E. Hummel Department of Materials Science and Engineering, University of Florida, Gainesville Search for more papers by this author R. E. Hummel, R. E. Hummel Department of Materials Science and Engineering, University of Florida, Gainesville Search for more papers by this author First published: 16 June 1988 https://doi.org/10.1002/pssa.2211070259Citations: 4 Gainesville, Florida 32611, USA. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL References 1 F. M. D'Heurle, Proc. IEEE 59, 1409 (1971). 2 R. E. Hummel and H. B. Huntington (Ed.), Electro- and Thermotransport in Metals and Alloys, AIME Publ., New York 1977. 3 P. B. Ghate, Proc. 20th Internat. Rel. Phys. Symp., IEEE, 1982 (p. 292). 4 H. A. Schafft, T. C. Grant, A. N. Saxena, and Chi-Yi Kao, Proc. Internat. Rel. Phys. Symp., IEEE, 1985 (p. 93). 5 J. R. Black, IEEE Trans. Electron Devices 16, 338 (1969). 6 H. Suhl and P. A. Turner, J. appl. Phys. 44, 4891 (1973). 7 J. Partridge and G. Littlefield, see /4/ (p. 119). 8 J. R. Black, Proc. 6th Internat. Rel. Phys. Symp., IEEE, 1967 (p. 148). 9 G. L. Hoffman and H. M. Breitling, Proc. IEEE 58, 833 (1970). 10 M. Shatzkes and J. R. Lloyd, J. appl. Phys. 59, 3890 (1986). 11 M. Ohring, Mater. Sci. Engng. 7, 158 (1971). 12 R. Rosenberg and M. Ohring, J. appl. Phys. 42, 5671 (1971). 13 J. D. Venables and R. G. Lye, Proc. 10th Internat. Rel. Phys. Symp., IEEE, 1972 (p. 159). 14 R. A. Sigsbee, J. appl. Phys. 44, 4891 (1973). 15 J. W. McPherson, Proc. 24th Internat. Rel. Phys. Symp., IEEE 1986 (p. 12). 16 R. E. Hummel, S. M. Goho, and R. T. Dehoff, Proc. 22nd Internat. Rel. Phys. Symp., IEEE 1984 (p. 234). 17 R. E. Hummel, R. T. Dehoff, S. M. Goho, and W. M. Goho, Thin Solid Films 78, 1 (1981). 18 R. E. Hummel, R. T. Dehoff, and H. J. Geier, J. Phys. Chem. Solids 37, 73 (1976). Citing Literature Volume107, Issue216 June 1988Pages K175-K179 ReferencesRelatedInformation" @default.
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