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• W2082294219 abstract "In this report, a brief description of the current progress at the Shanghai EBIT project is presented. This is followed by a short discussion of the measurement of various parameters (electron beam diameter and ion density) under a number of operational conditions. A brief introduction to di-electronic recombination measurements for highly ionized xenon is given. Next, we present a preliminary measurement of the time dependence of xenon X-ray emission lines. Finally, a comparison of calculated and experimental charge-state distributions is given. This shows the influence of multi-electron capture and different distributions of the ion cloud on the charge state distribution.PACS Nos.: 41.85.–p; 34.80.Kw; 34.80Lx" @default.
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• W2082294219 date "2008-01-01" @default.
• W2082294219 modified "2023-09-26" @default.
• W2082294219 title "Progress and research at the Shanghai EBIT" @default.
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• W2082294219 doi "https://doi.org/10.1139/p07-161" @default.
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