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• W2082709300 abstract "High-temperature performance of state-of-the-art n-channel triple-gate transistors with 15 nm fin-width, 60 nm fin-height, undoped body, high-k gate dielectric and metal gate is reported. The degradation of the on-current, transconductance and subthreshold swing, the shift in threshold voltage, the increase in gate/drain leakages and off-current with the temperature are analyzed up to 200 °C. The comparison of short- and long-channel devices and the overall excellent performance at high temperature are outlined." @default.
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• W2082709300 date "2007-12-01" @default.
• W2082709300 modified "2023-10-16" @default.
• W2082709300 title "High-temperature performance of state-of-the-art triple-gate transistors" @default.
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• W2082709300 doi "https://doi.org/10.1016/j.microrel.2006.10.002" @default.
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