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- W2083427144 abstract "Temperature dependence of current-voltage (I -V ) characteristics of quantum-confined GaAs ultra-shallow sidewall p+n+ tunnel junctions has been investigated. The sidewall tunnel junctions with junction depths ranging from 5 nm to 50 nm were achieved by the combination of intermittent injection of TEG/AsH3 in an ultra high vacuum and a wet etching process of the GaAs growth layer. From the I -V results, abrupt negative differential resistances (NDR) were observed, which relate to direct/indirect tunneling and sub-band formation. The change in the number instances of NDR and their voltage positions also depended on the junction depth. Mechanisms of tunneling in the present sidewall tunnel junction will be discussed from the point of the sub-band formation in conduction bands. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)" @default.
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- W2083427144 date "2006-03-01" @default.
- W2083427144 modified "2023-09-25" @default.
- W2083427144 title "Tunneling in quantum confined GaAs ultrashallow sidewall tunnel junctions" @default.
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- W2083427144 doi "https://doi.org/10.1002/pssc.200564135" @default.
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