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- W2083492623 abstract "We have used level crossing analysis to obtain further insights on roughness and multifractality. In addition, sources of multifractality could be specified by using shuffling and surrogate procedures. We have shown how these concepts could explain a rough surface for the purpose of suitable application and how experimental parameters can affect its properties. To make it more clear, we have used laser-induced etching of silicon in some interfaces such as water, ethanol and air, as an example. The effect of liquid interfaces on generating topographic rough surfaces in silicon has been studied using the atomic force microscopy technique (AFM)." @default.
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- W2083492623 date "2008-03-07" @default.
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- W2083492623 title "Stochastic features of rough surfaces: analysis of laser-induced silicon surface modification" @default.
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- W2083492623 doi "https://doi.org/10.1088/1742-5468/2008/03/p03002" @default.
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