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- W2083757675 abstract "The phase shift method for the measurement of semiconductor carrier lifetime has been extended by the use of a light beam modulated at frequencies up to 4 Mc with a Kerr cell, to provide direct measurement of lifetimes down to at least 10−8 sec. Some typical results for the temperature variation of lifetime in indium antimonide are presented." @default.
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- W2083757675 date "1962-12-01" @default.
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- W2083757675 title "Technique for the Measurement of Short Carrier Lifetimes" @default.
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- W2083757675 doi "https://doi.org/10.1063/1.1717771" @default.
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