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• W2084736005 startingPage "359" @default.
• W2084736005 abstract "We have demonstrated the potentials of a field emission scanning tunneling microscope (FE-STM), in which the STM tip can be operated as a stable field electron emission gun. The tips were treated by a thermal-field (T-F) method for remolding and cleaning. A well-controlled T-F treated tip can determine the electric field between tip and sample in the STM as a geometrical boundary condition. Using the treated tip the electron standing waves excited in a vacuum gap between tip and sample were analyzed, and the electric field near sample surfaces was evaluated by assuming a simple potential model. Furthermore, by irradiating sample surfaces with a high-energy electron beam emitted from the tip, we obtained electron energy loss spectra (EELS) and Auger electron spectra from semiconductors, HOPG and metals." @default.
• W2084736005 created "2016-06-24" @default.
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• W2084736005 date "2002-01-01" @default.
• W2084736005 modified "2023-09-26" @default.
• W2084736005 title "Surface Spectroscopy Utilizing Field Electron Emission from Thermal-field Treated Tips in STM" @default.
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• W2084736005 doi "https://doi.org/10.1384/jsa.9.359" @default.
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