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• W2085157095 abstract "The availability of intense sources of continuous radiation in the X-ray region has stimulated the development of a technique for structure determination which is particularly suited to studies of local environment in complex systems. The absorption cross section for the photoexcitation of an electron from a deep core state to a continuum state exhibits oscillations as a function of photon energy known as the extended X-ray absorption fine structure, or EXAFS. These oscillations result from the interference between the outgoing photoelectron wavefunction and that portion of it scattered back from neighboring atoms, and therefore contain considerable information about the local environment of the excited atom species. Analysis of the EXAFS can yield not only the distance but also the type and number of the nearest neighbors of the excited atom. The purpose of this paper is to discuss briefly the theoretical background and the practical aspects of EXAFS data analysis. The discussion is then illustrated through application of these techniques to EXAFS studies of arsenic dopants in amorphous silicon and of PdGe metallic glass." @default.
• W2085157095 created "2016-06-24" @default.
• W2085157095 creator A5012274664 @default.
• W2085157095 date "1978-12-01" @default.
• W2085157095 modified "2023-09-24" @default.
• W2085157095 title "EXAFS studies of disordered solids" @default.
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• W2085157095 doi "https://doi.org/10.1016/0022-3093(78)90099-6" @default.
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