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- W2085201911 abstract "Resistance fluctuations with a power spectrum of approximately 1/f have been studied in amorphous thin films of ${mathrm{Ni}}_{30}$${mathrm{Zr}}_{70}$ and ${mathrm{Ni}}_{50}$${mathrm{Zr}}_{50}$ in the temperature range 4<T<350 K. The primary noise-generating source was found to be hydrogen contamination with concentrations up to roughly 30 at. %. Exceptionally large peaks in the spectral density versus T corresponding to short-range hopping of hydrogen atoms were found between 90 and 200 K. The rms resistivity change due to short-range hopping of a hydrogen atom was found to be larger than the average resistivity increase per atom, indicating the importance of the random local environment. Below 50 K the noise increased with decreasing temperature and was reduced by magnetic fields, indicating a universal conductance-fluctuation-coupling mechanism." @default.
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- W2085201911 date "1989-07-15" @default.
- W2085201911 modified "2023-10-18" @default.
- W2085201911 title "Resistance noise in amorphous Ni-Zr: Hydrogen diffusion and universal conductance fluctuations" @default.
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- W2085201911 doi "https://doi.org/10.1103/physrevb.40.900" @default.
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