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- W2085242517 abstract "A novel technique, AFM potentiometry (AFMP), for nanoscale potential mapping has been developed by combining an intermittent-contact-mode AFM with a conductive cantilever which is connected to an electrometer. Potential resolution and limitations of the technique are discussed. TTF-TCNQ wire-like crystals connecting two electrodes were measured with the AFMP under application of a voltage to the electrodes. The potential image indicated that the resistance localized at the grain boundaries was much larger than that distributed within the grains." @default.
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- W2085242517 date "2003-04-01" @default.
- W2085242517 modified "2023-10-17" @default.
- W2085242517 title "Development of AFM potentiometry for potential mapping of organic conductors" @default.
- W2085242517 doi "https://doi.org/10.1016/s0379-6779(02)01126-8" @default.
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