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• W2085874017 startingPage "031908" @default.
• W2085874017 abstract "We present kinetic nonlattice Monte Carlo atomistic simulations to investigate the role of Si interstitials in B cluster dissolution. We show that the presence of Si interstitials from an oxidizing anneal stabilize B clusters and slow down B cluster dissolution, compared to anneal in inert ambient. We have also analyzed the influence of injected Si interstitials from end of range defects, due to preamorphizing implants, on B deactivation and reactivation processes. We have observed that the B cluster evolution can be clearly correlated to the evolution of Si interstitial defects at the end of range. The minimum level of activation occurs when the Si interstitial supersaturation is low because the end of range defects have dissolved or reach very stable configurations, such as dislocation loops." @default.
• W2085874017 created "2016-06-24" @default.
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• W2085874017 date "2005-01-17" @default.
• W2085874017 modified "2023-10-18" @default.
• W2085874017 title "Role of silicon interstitials in boron cluster dissolution" @default.
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• W2085874017 doi "https://doi.org/10.1063/1.1852728" @default.
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