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• W2085955574 abstract "The paper deals with the problem of test data volume, test application time and on-chip test decompressor hardware overhead of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This new technique significantly reduces test application time by utilizing a new on-chip test decompressor architecture presented in this paper." @default.
• W2085955574 created "2016-06-24" @default.
• W2085955574 creator A5022694508 @default.
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• W2085955574 date "2012-04-01" @default.
• W2085955574 modified "2023-10-14" @default.
• W2085955574 title "On test time reduction using pattern overlapping, broadcasting and on-chip decompression" @default.
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• W2085955574 doi "https://doi.org/10.1109/ddecs.2012.6219078" @default.
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