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• W2086026088 abstract "physica status solidi (a)Volume 84, Issue 1 p. K23-K27 Short Note Electron microscope and electron diffraction studies of amorphization phenomena in Ge implanted with Te ions N. Pashov, N. Pashov Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorG. Kätner, G. Kätner Institute of Solid State Physics and Electron Microscopy, Academy of Sciences of the GDR, Halle (Saale) Search for more papers by this authorM. Kalitzova, M. Kalitzova Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorS. Simov, S. Simov Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorM. Mikhailov, M. Mikhailov Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorK. Kolev, K. Kolev Institute of Electronics, Bulgarian Academy of Sciences, Sofia Search for more papers by this author N. Pashov, N. Pashov Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorG. Kätner, G. Kätner Institute of Solid State Physics and Electron Microscopy, Academy of Sciences of the GDR, Halle (Saale) Search for more papers by this authorM. Kalitzova, M. Kalitzova Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorS. Simov, S. Simov Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorM. Mikhailov, M. Mikhailov Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia Search for more papers by this authorK. Kolev, K. Kolev Institute of Electronics, Bulgarian Academy of Sciences, Sofia Search for more papers by this author First published: 16 July 1984 https://doi.org/10.1002/pssa.2210840150Citations: 1 72 blvd. Lenin, 1184 Sofia, Bulgaria. Weinberg, DDR-4020 Hall (Saale), GDR. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL References 1 O. A. Novozhilov, I. B. Khaibulin, S. R. Novikov, E. I. Shtirkov, and G. G. Zakirov, Internat. Conf. Ion Implantation in Semiconductors, Reinhardsbrunn (GDR) 1977 (p. 120). 2 B. R. Appleton, O. W. Holland, and J. Narayan, Appl. Phys. Letters 41, 711 (1982). 3 O. W. Holland, B. R. Appleton, and J. Narayan, J. appl. Phys. 54, 2295 (1983). 4 N. Paschoff, phys. stat. sol. 22, 83 (1967). 5 N. Pashov, G. Kästner, S. Simov, M. Kalitzova, M. Mikhailov, and K. Kolev, 10th Internat. Congr. Electron Microscopy, Hamburg 1982, Vol. 2 (p. 391). 6 F. Paasche, H. Olbricht, U. Scherstag, P. Lamparter, and S. Steeb, Z. Naturforsch. 37a, 1139 (1982). 7 P. Sigmund, Appl. Phys. Letters 25, 169 (1974). 8 L. M. Howe, M. H. Rainville, H. K. Haugen, and D. A. Thompson, Nuclear Instrum. and Methods 170, 419 (1980). 9 J. Washburn, C. S. Murty, R. Sadana, P. Byrne, R. Gronsky, N. Cheung, and R. Kilaas, Nuclear Instrum. and Methods 209/210, 345 (1983). 10 L. I. Tatarinova, Elektronografiya amorfnykh veshchestv, Nauka, Moscow 1972. 11 J. I. Stetziv, Kristallografiya 18, 25 (1979). 12 G. A. N. Conell and G. Lucovsky, J. non-crystall Solids 31, 123 (1978). 13 G. Breitling, J. Vacuum Sci. Technol. 6, 628 (1969). Citing Literature Volume84, Issue116 July 1984Pages K23-K27 ReferencesRelatedInformation" @default.
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