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• W2087488788 abstract "The wavelength dependences of the magnetooptic Kerr rotation angle (θ <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>K</sub> ) and reflectivity (R) of thin Fe and TbFe films on top of (Cu/SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> ) multilayer films have been measured in the wavelength region from 400 to 900 nm. The onset wavelength at which the reflectivity of (Cu/SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> ) multilayer films begins to increase shifts toward longer wavelengths starting from the absorption edge of Cu as the SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> layer thickness is increased. The θ <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>k</sub> of Fe and TbFe films on top of these (Cu/SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> ) multilayer films is enhanced by more than a factor of three at the onset wavelength for these multilayer films, while reflectivities take on minima. The figure of merit √R θ <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>k</sub> of these films, reaches twice the value of bulk metals at the θ <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>K</sub> peak wavelength. The calculated √R η <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>k</sub> of Fe and TbFe/ (Cu/SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> ) using the optical constants of Fe, TbFe, Cu and SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> and taking optical interference into consideration, agrees with experimental results. With proper choice of the thickness of Cu and SiO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> , the figure of merit √R θ <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>k</sub> can be enhanced at any wavelength." @default.
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• W2087488788 title "Magneto-Optical Kerr Rotation Spectra for Fe and TbFe Films on (Cu/SiO2) Multilayered Films" @default.
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• W2087488788 doi "https://doi.org/10.1109/tjmj.1992.4565350" @default.
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